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Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Yonghua Rong
Livre relié | Anglais
208,95 €
+ 417 points
Description
"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations.
The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.
Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.
Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
Spécifications
Parties prenantes
- Auteur(s) :
- Editeur:
Contenu
- Nombre de pages :
- 500
- Langue:
- Anglais
Caractéristiques
- EAN:
- 9783642201189
- Format:
- Livre relié
- Dimensions :
- 155 mm x 235 mm
