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Software Trace and Log Analysis
A Pattern Reference
Dmitry Vostokov, Software Diagnostics Institute
Livre broché | Anglais
41,95 €
+ 83 points
Format
Description
General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 133 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 9 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). Full-color diagrams accompany most pattern descriptions. The second edition includes 33 more patterns and improved pattern index.
Spécifications
Parties prenantes
- Auteur(s) :
- Editeur:
Contenu
- Nombre de pages :
- 224
- Langue:
- Anglais
Caractéristiques
- EAN:
- 9781908043825
- Date de parution :
- 14-12-16
- Format:
- Livre broché
- Format numérique:
- Trade paperback (VS)
- Dimensions :
- 140 mm x 216 mm
- Poids :
- 362 g
