- Retrait gratuit dans votre magasin Club
- 7.000.000 titres dans notre catalogue
- Payer en toute sécurité
- Toujours un magasin près de chez vous
- Retrait gratuit dans votre magasin Club
- 7.000.000 titres dans notre catalogue
- Payer en toute sécurité
- Toujours un magasin près de chez vous
Résultats pour "Sung-Mo (Steve) Kang"
-
Hot-Carrier Reliability of Mos VLSI Circuits
Yusuf Leblebici, Sung-Mo (Steve) Kang
- Livre relié | Anglais | The Springer International Engineering and Computer Science | n° 227
- As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is ... Savoir plus
295,45 €Livraison 1 à 2 semaines295,45 €Livraison 1 à 2 semaines -
Physical Design for Multichip Modules
Mysore Sriram, Sung-Mo (Steve) Kang
- Livre broché | Anglais | The Springer International Engineering and Computer Science | n° 267
- Physical Design for Multichip Modules collects together a large body of important research work that has been conducted in recent years in the area of... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Physical Design for Multichip Modules
Mysore Sriram, Sung-Mo (Steve) Kang
- Livre relié | Anglais | The Springer International Engineering and Computer Science | n° 267
- Physical Design for Multichip Modules collects together a large body of important research work that has been conducted in recent years in the area of... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Design Automation for Timing-Driven Layout Synthesis
S Sapatnekar, Sung-Mo (Steve) Kang
- Livre broché | Anglais | The Springer International Engineering and Computer Science | n° 198
- Moore's law [Noy77], which predicted that the number of devices in- tegrated on a chip would be doubled every two years, was accurate for a number of ... Savoir plus
259,45 €Livraison 1 à 4 semaines259,45 €Livraison 1 à 4 semaines -
Modeling of Electrical Overstress in Integrated Circuits
Carlos H Diaz, Sung-Mo (Steve) Kang, Charvaka Duvvury
- Livre broché | Anglais | The Springer International Engineering and Computer Science | n° 289
- Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability co... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo (Steve) Kang
- Livre relié | Anglais
- Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrotherma... Savoir plus
177,45 €Livraison 1 à 2 semaines177,45 €Livraison 1 à 2 semaines -
Modeling of Electrical Overstress in Integrated Circuits
Carlos H Diaz, Sung-Mo (Steve) Kang, Charvaka Duvvury
- Livre relié | Anglais | The Springer International Engineering and Computer Science | n° 289
- Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability co... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo (Steve) Kang
- Livre broché | Anglais
- This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks t... Savoir plus
162,45 €Livraison 1 à 2 semaines162,45 €Livraison 1 à 2 semaines -
Design Automation for Timing-Driven Layout Synthesis
S Sapatnekar, Sung-Mo (Steve) Kang
- Livre relié | Anglais | The Springer International Engineering and Computer Science | n° 198
- Moore's law [Noy77], which predicted that the number of devices in- tegrated on a chip would be doubled every two years, was accurate for a number of ... Savoir plus
259,45 €Livraison 1 à 4 semaines259,45 €Livraison 1 à 4 semaines -
Hot-Carrier Reliability of Mos VLSI Circuits
Yusuf Leblebici, Sung-Mo (Steve) Kang
- Livre broché | Anglais | The Springer International Engineering and Computer Science | n° 227
- As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is ... Savoir plus
335,95 €Livraison 2 à 3 semaines335,95 €Livraison 2 à 3 semaines -
CMOS Digital Integrated Circuits Analysis & Design
Sung-Mo (Steve) Kang, Yusuf Leblebici, Chul Woo Kim
- Livre relié | Anglais
- CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehens... Savoir plus
311,45 €Date de disponibilité inconnue311,45 €Date de disponibilité inconnue
11 sur 11 résultat(s) affiché(s)