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- Toujours un magasin près de chez vous
Transient Electromagnetic-Thermal Nondestructive Testing
Pulsed Eddy Current and Transient Eddy Current Thermography
Yunze He, Bin Gao, Ali Sophian, Ruizhen Yang
Livre broché | Anglais
174,45 €
+ 348 points
Description
Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth.
In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan, B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM).
The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields.
Spécifications
Parties prenantes
- Auteur(s) :
- Editeur:
Contenu
- Nombre de pages :
- 374
- Langue:
- Anglais
Caractéristiques
- EAN:
- 9780128127872
- Date de parution :
- 29-05-17
- Format:
- Livre broché
- Format numérique:
- Trade paperback (VS)
- Dimensions :
- 152 mm x 226 mm
- Poids :
- 362 g
