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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors ...Savoir plus
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Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses variou...Savoir plus
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The design and optimization of electronic systems often requires appraisal an of the electrical noise generated by active devices, and, at a technolog...Savoir plus
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This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devi...Savoir plus
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