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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal suffi...Savoir plus
Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and...Savoir plus
This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric ...Savoir plus
There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statis...Savoir plus
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and ma...Savoir plus
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behavio...Savoir plus
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques use...Savoir plus
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the...Savoir plus
Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti...Savoir plus
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillatio...Savoir plus
This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a compreh...Savoir plus
The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect...Savoir plus
Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to as...Savoir plus
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first pr...Savoir plus
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation...Savoir plus
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as ...Savoir plus
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func...Savoir plus
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our think...Savoir plus
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as ...Savoir plus
Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing def...Savoir plus
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a ...Savoir plus
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While...Savoir plus
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to be...Savoir plus
Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti...Savoir plus