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Vous voulez être sûr que vos cadeaux seront sous le sapin de Noël à temps? Nos magasins vous accueillent à bras ouverts. La plupart de nos magasins sont ouverts également les dimanches, vous pouvez vérifier les heures d'ouvertures sur notre site.
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- Payer en toute sécurité
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Résultats pour "Frontiers in Electronic Testing"
-
Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 30
- Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. Th... Savoir plus
167,95 €Livraison 2 à 3 semaines167,95 €Livraison 2 à 3 semaines -
Multi-Chip Module Test Strategies
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 7
- MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cos... Savoir plus
139,95 €Livraison 1 à 2 semaines139,95 €Livraison 1 à 2 semaines -
Efficient Branch and Bound Search with Application to Computer-Aided Design
Xinghao Chen, Michael L Bushnell
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 4
- Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and ma... Savoir plus
167,95 €Livraison 1 à 2 semaines167,95 €Livraison 1 à 2 semaines -
Embedded Processor-Based Self-Test
Dimitris Gizopoulos, A Paschalis, Yervant Zorian
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 28
- Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Data Mining and Diagnosing IC Fails
Leendert M Huisman
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 31
- There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statis... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
Advances in Electronic Testing
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 27
- This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a compreh... Savoir plus
251,45 €Livraison 1 à 2 semaines251,45 €Livraison 1 à 2 semaines -
Introduction to Advanced System-On-Chip Test Design and Optimization
Erik Larsson
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 29
- SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SO... Savoir plus
251,45 €Livraison 1 à 2 semaines251,45 €Livraison 1 à 2 semaines -
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 23
- Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques use... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
Test Resource Partitioning for System-On-A-Chip
Vikram Iyengar, Anshuman Chandra
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 20
- Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SO... Savoir plus
167,95 €Livraison 1 à 2 semaines167,95 €Livraison 1 à 2 semaines -
On-Line Testing for VLSI
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 11
- Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func... Savoir plus
167,95 €Livraison 1 à 2 semaines167,95 €Livraison 1 à 2 semaines -
The Core Test Wrapper Handbook
Francisco Da Silva, Teresa McLaurin, Tom Waayers
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 35
- In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to be... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
High Performance Memory Testing
R Dean Adams
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 22
- Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bi... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Boundary-Scan Interconnect Diagnosis
José T de Sousa, Peter Y K Cheung
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 18
- Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to as... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Elements of Stil
Gregory A Maston, Tony R Taylor, Julie N Villar
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 24
- Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
Oscillation-Based Test in Mixed-Signal Circuits
Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 36
- Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillatio... Savoir plus
223,95 €Livraison 1 à 2 semaines223,95 €Livraison 1 à 2 semaines -
Introduction to Iddq Testing
S Chakravarty, Paul J Thadikaran
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 8
- Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a ... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 34
- This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric ... Savoir plus
181,95 €Livraison 1 à 2 semaines181,95 €Livraison 1 à 2 semaines -
Soft Errors in Modern Electronic Systems
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 41
- Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti... Savoir plus
259,45 €Livraison 1 à 4 semaines259,45 €Livraison 1 à 4 semaines -
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
M Bushnell, Vishwani Agrawal
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 17
- The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, ... Savoir plus
153,95 €Livraison 1 à 2 semaines153,95 €Livraison 1 à 2 semaines -
Elements of Stil
Gregory A Maston, Tony R Taylor, Julie N Villar
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 24
- Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and... Savoir plus
195,95 €Livraison 1 à 2 semaines195,95 €Livraison 1 à 2 semaines -
Testability Concepts for Digital ICS
F P M Beenker, R G Bennetts, A P Thijssen
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 3
- Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behavio... Savoir plus
259,45 €Livraison 2 à 3 semaines259,45 €Livraison 2 à 3 semaines -
Multi-Chip Module Test Strategies
- Livre relié | Anglais | Frontiers in Electronic Testing | n° 7
- MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cos... Savoir plus
167,95 €Livraison 2 à 3 semaines167,95 €Livraison 2 à 3 semaines -
Timing Performance of Nanometer Digital Circuits Under Process Variations
Victor Champac, Jose Garcia Gervacio
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 39
- This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a ... Savoir plus
126,95 €Livraison sous 1 à 4 semaines126,95 €Livraison sous 1 à 4 semaines -
Introduction to Advanced System-On-Chip Test Design and Optimization
Erik Larsson
- Livre broché | Anglais | Frontiers in Electronic Testing | n° 29
- SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SO... Savoir plus
181,95 €Livraison 1 à 2 semaines181,95 €Livraison 1 à 2 semaines